ATE Test Engineering

Our Services

New Program Development

Legacy to Roadmap Conversion

Single to Multisite Conversion

Debug

Test Time Reduction

Yield Improvement

New Program Development

Legacy to Roadmap Conversion

Single to multisite Conversion

Debug

Test Time Reduction

Yield Improvement

Why Us?

Highly experienced engineering team
Proven track record with no test excursion in last 25+ years
Superior project execution using customizable project management software.
Collaborative effort with clients

Test platform and Device Type Experience

Test Platforms:

  • Teradyne ETS
  • Teradyne Flex
  • Teradyne J750
  • Advantest V93k
  • VLCT/Vseries
  • Various Legacy Testers

Product Areas

  • High-Speed Digital
  • Mixed signal
  • Complex SoC
  • RF
  • ADCs, DACs
  • Power

Product Areas:

  • Logic
  • Switches
  • Sense-amps
  • DSPs
  • Microcontrollers

Our Process